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Georgia Institute of Technology
Packaging Research Center
An NSF Engineering Research Center
Leading the SOP & Nano Packaging Paradigms in Partnership with Global Industry

e-newsletter
Vol. 2, Issue 1 – Feb. 2005
 

Quick Jump  
Books on Emerging Technologies from PRC: Book on SOP
PRC Shares Research Results and Future Directions with IAB
Selective Research Accomplishments
New Research Focus

New Research Fellows Join PRC
Visiting Scholars to PRC
Workshops on Emerging Technologies
Infrastructure Partners

Books on Emerging Technologies from PRC: Book on SOP
After a very successful publication of first text book from PRC—"Fundamentals of Microsystems Packaging,” which is now used by 51 universities around the world, the PRC is now embarking on bringing out the first book on SOP, comparing it to SIP and SOC. "Introduction to System On Package" which will cover the concepts of SOC, SIP and SOP, followed by 9 chapters on various topics that constitute SOP, essentially highlighting the research accomplishments of PRC and the community over the past ten years. The Chief Editor is Prof. Rao R. Tummala with authors from Georgia Tech, other universities and industry. The book is slated for publication by McGraw-Hill by December 2006. (Contact Mahesh Varadarajan: mahesh@ece.gatech.edu)

PRC Shares Research Results and Future Directions with its IAB Members
The Packaging Research Center (PRC) recently held its semi-annual Industry Advisory Board (IAB) on March 3-4 where the most recent advanced microelectronics packaging and integration research results were shared with the Center's industry partners. In addition, time was also devoted to identifying possible new research directions and topics. Below is a list of topics and the name of the person that came from this discussion, to be considered by PRC:

 

Selective Research Accomplishments of PRC

High Density Wiring and Low Loss Dielectrics
PRC has recently demonstrated 6-10um lines and spaces and 20um microvias in low loss BCB dielectric for ultra-high density SOP substrates. A novel process for low-cost additive metallization of BCB with plasma surface treatment and electroless and electrolytic copper plating has been developed. This multilayer wiring process has been implemented on low CTE, high modulus C-SiC composite and high Tg organic laminate substrates. Prototype multilayer package substrates for 50 to 100um pitch flip-chip interconnects are under development. (Contact Venky Sundaram: vsunda@ece.gatech.edu)

Embedded Passives
The PRC and Endicott Interconnect Technologies have partnered in design and fabrication of an 8-layer SOP prototype with embedded passive components to the specifications provided by the Telecom Industry. Thin film resistors on a carrier copper foil as well as polymer thick films were used for resistors in the range of 25 ohms to 100 kohms. The capacitors were polymer-ceramic nanocomposites with capacitance in the range of 0.1 to 2 nF/cm 2 and were designed to function up to 5 GHz. The objective of this study was to show the manufacturability of multi-layer multifunction SOP and address issues related to reproducibility, reworkability, yield, tolerance, and thermo-mechanical reliability. In Phase II of this project, PRC and EI Technology expect to work with numerous materials companies to identify niche materials and processes for future digital and RF applications. (Contact Dr. Swapan Bhattacharya: swapan@ece.gatech.edu)

Novel Rigid Composite Substrate Technology
PRC, in collaboration with Starfire Systems, initiated the ceramic composite substrate technology program in 2002 to develop new rigid substrates with unique set of properties not available today. The proprietary polymer-derived rigid substrate technology enables high stiffness with Si-match CTE without compromising large-area processability and cost. With these new composite boards, flip chip reliability without underfill was demonstrated using 200 micron pitch, 5 mm size test chips using thin BCB and low CTE PPE dielectrics. Although low CTE boards increase the dielectric stresses in the build-up layers, with proper thermomechanical design, >1000 cycle microvia and dielectric reliability was demonstrated with Cu/BCB build-up layers. Advanced prototypes opto 2 cm die and 50-100 micron pitch interconnects are now under evaluation. (Contact Dr. Raj Pulugurtha: raj@ee.gatech.edu)

 

New Research Focus

PRC Proposes Embedded Actives and Alternatives in its SOP and SIP Approach
In “Embedded-Active” technology, thinned active chips are integrated in a ceramic or organic substrate and interconnect layers are formed to the active components. This technology creates new opportunities to increase performance, functionality and packing density by:

  • providing short connections to the chip, which can reduce noise, signal delay and power consumption, and enhance performance to the GHz range,
  • facilitating the integration of heterogeneous devices, signals and materials, and
  • reducing footprint occupied by package on board and enabling 3D packaging technologies easily.

Despite its compelling potential advantages, embedded active technology has been limited by a number of factors such as electrical and mechanical design, process for interconnecting and embedding ICs, thermal issues andthermo-mechanical reliability. At PRC, a team of people with the above expertise are proposing to solve the problems as well as propose alternatives. (Contact Dr. Baik-Woo Lee: baikwoo@ece.gatech.edu)

Industry-Academic Workshop on Packaging of Cu-low K on April 26, 2005 at GT
Georgia Tech-PRC proposes an Industry-Academic Workshop on Copper low-K. While the industry has introduced copper with low-K, true low-K around 2.2-2.5 remains a challenge. PRC would like some of its expertise to bring about a total System approach to Cu low-K with focus on Electrical and Mechanical IC/package co-design. The research focus would be in the following areas:

  • New substrates with low TCE for low stress
  • Multiple approaches to interconnections
  • Low-K characterization and adhesion
  • Advanced assembly processes to low-K
  • Test vehicles and reliability assessment

For more information and registration details on the Workshop you may visit the PRC web site at: http://www.prc.gatech.edu/events/culowk/2005/index.htm (Contact Prof. Suresh Sitaraman: suresh.sitaraman@me.gatech.edu)

WOB (Wire on Bump) SIP Technology
PRC has developed a new approach for memory chip stacking called Wire-on-Bumps (WOB) with lower cost, better electrical properties and higher Si efficiency than conventional wire bonding, interposer or Si through via technologies. The new WOB technology is based on peripheral pad redistribution and formation of solder bumps followed by straight and vertical wire bonding. The memory chip stack by WOB can then be mounted on mother board by balls or wires, with or without interposer for consumer or harsh applications.The WOB technology is under development and PRC is looking for industry partners to further envision this technology and its applications. (Contact Dr. Chong Yoon: cyoon@ece.gatech.edu)

 

New Research Fellows join PRC

‘Lilly’ Jui-Yun Tsai has a PhD degree in Chemical and Material Engineering from National Central University, Taiwan, in 2004. She will work on fine-pitch flip-chip assembly process including reliability test, wire-on-bump (WOB) for 3-D packaging and lead-free wafer bumping process at PRC. (jt05@ece.gatech.edu)

Baik-Woo Lee received his PhD degree in material science and engineering from Seoul National University, Korea, in 2004 and will work on embedded actives, wire-on-bump (WOB) for 3-D package stacking and nanocomposite capacitor at PRC. (baikwoo@ece.gatech.edu)

Ege Engin was with the Fraunhofer Institute IZM from 2001 to 2004. He received his PhD from the University of Hannover, Germany in 2004 and he will work in the areas of mixed-signal design, and electrical modeling and characterization of IC packages. (engin@ece.gatech.edu)

Boyd Wiedenman received his B.S. in Chemistry from Colorado State University in 1995. He has ten years of industry experience with semiconductor fabrication process integration and MEMS process development, most recently from Sandia National Laboratories, California. He is currently a Research Engineer with the PRC at Georgia Institute of Technology working with digital wiring and dielectrics, embedded passives, and process integration for next generation system on packages (SOP) platforms. (bwiedenman@ece.gatech.edu)

 

Visiting Scholars to PRC
Dr. Yoshitaka Toyota
from Okayama University, Japan has joined the Epsilon Group at Georgia Tech in 2005. He will work on optical interconnection on PCB, EMC design for high-speed digital systems etc. (yoshitaka.toyota@ece.gatech.edu)

 

Workshops on Emerging Technologies

The Second International Workshop on Nano and Bio-Electronics Packaging will be held March 22-23, 2005 at the Technology Square Research Building, Georgia Tech. The Workshop will have 5 keynote speakers and 6 technical sessions. The Conference Chairs are Prof. Rao R. Tummala and Prof. Z L Wang. The Conference Coordinator is Dr. Swapan Bhattacharya. (swapan@ece.gatech.edu)

PRC and IEEE-CPMT jointly sponsor the First International Workshop on 3S (SOC • SIP • SOP) Electronics Technologies on September 22 and 23, 2005 at the Global Learning and Conference Center, Georgia Tech, Atlanta. Prof. Rao R. Tummala is the General Conference Chair. Boyd Weidenman is the Program Coordinator (bwieden@ece.gatech.edu). More details are also available at the PRC web site: www.prc.gatech.edu/3s

 

Infrastructure Partners

The PRC wishes to extend thanks to its infrastructure partner, BTU International, for its support of the recently-installed Pyramax 98 belt reflow oven for use in eutectic and lead-free interconnect research and test bed assembly efforts. (Contact Dean Sutter: dean.sutter@ee.gatech.edu)

 


Georgia Institute of Technology Packaging Research Center
- An NSF Engineering Research Center -
Leading the SOP & Nano Packaging Paradigms in Partnership with Global Industry

For further info, please visit: http://www.prc.gatech.edu

PH: 404-894-9097, FAX: 404-894-3842 • 813 Ferst St., MaRC Bldg. 351 • Atlanta, GA 30332-0560


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